We routinely use results from microscopy studies to complement analytical data from other techniques to address your solid state characterization issues. Microscopy with appropriate sample handling is also a powerful tool for trace analysis.

We offer complete microscopy capabilities:

  • Light microscopy including polarizing, bright field and dark field
  • Fluorescence
  • Infrared (IR)
  • Raman
  • Scanning electron microscopy (SEM)
    • High vacuum
    • Low vacuum
    • Energy dispersive X-ray analysis (EDX)
  • Hot stage (light microscopy, IR, Raman)
  • Cold stage (light microscopy, IR, Raman)
  • Stereomicroscopy

Contact our solid state services team at SSCI by clicking below

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