We routinely use results from microscopy studies to complement analytical data from other techniques to address your solid state characterization issues. Microscopy with appropriate sample handling is also a powerful tool for trace analysis.
We offer complete microscopy capabilities:
- Light microscopy including polarizing, bright field and dark field
- Fluorescence
- Infrared (IR)
- Raman
- Scanning electron microscopy (SEM)
- High vacuum
- Low vacuum
- Energy dispersive X-ray analysis (EDX)
- Hot stage (light microscopy, IR, Raman)
- Cold stage (light microscopy, IR, Raman)
- Stereomicroscopy
Contact our solid state services team at SSCI by clicking below